Semiconductor Material and Device Characterization by Dieter K. Schroder
Wiley-IEEE Press; 3 edition | January 30, 2006 | English | ISBN: 0471739065 | 790 pages | PDF | 12 MB
This Third Edition updates a landmark text with the latest findings. The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques.
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