This book presents the physical and technical foundation of the state of
the art in applied scanning probe techniques. It constitutes a timely and
comprehensive overview of SPM applications. The chapters in this volume
relate to scanning probe microscopy techniques, characterization of various
materials and structures and typical industrial applications, including
topographic and dynamical surface studies of thin-film semiconductors,
polymers, paper, ceramics, and magnetic and biological materials. The chapters
are written by leading researchers and application scientists from all over
the world and from various industries to provide a broader perspective.

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