Charles A. Evans, C. Richard Brundle, Shaun Wilson
English
1992
ISBN: 0750691689 9780750691680
782 pages
PDF
This is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume in the Materials Characterization Series is a unique, stand-alone reference for materials science practitioners, process engineers, students and anyone with a need to know about the capabilities available in materials analysis.
An encyclopedia of 50 concise articles, this book will also be a practical companion to the forthcoming books in the Series. It describes widely-ranging techniques in a jargon-free manner and includes summary pages for each technique to supply a quick survey of its capabilities.

Contents
Preface to Series
Preface
Acronyms Glossary
Contributors
INTRODUCTION AND SUMMARIES
IMAGING TECHNIQUES (MICROSCOPY)
ELECTRON BEAM INSTRUMENTS
STRUCTURE DETERMINATION BY DIFFRACTION AND SCATTERING
ELECTRON EMISSION SPECTROSCOPIES
X-RAY EMISION TECHNIQUES
VISIBLE/W EMISSION, REFLECTION, AND ABSORPTION
VIBRATIONAL SPECTROSCOPIES AND NMR
ION SCATTERING TECHNIQUFS
MASS AND OPTICAL SPECTROSCOPIES
NEUTRON AND NUCLEAR TECHNIQUES
PHYSICAL AND MAGNETIC PROPERTIES
Index

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